DocumentCode
845852
Title
Applications of Synchrotron Radiation
Author
Bienenstock, Arthur
Author_Institution
Stanford Synchrotron Radiation Laboratory, Stanford University, Stanford CA 94305
Volume
26
Issue
3
fYear
1979
fDate
6/1/1979 12:00:00 AM
Firstpage
3779
Lastpage
3784
Abstract
Following a brief review of its properties, discussions are presented of the application of synchrotron radiation to: (a) the determination of atomic arrangements using extended x-ray absorption fine structure (EXAFS); (b) the determination of atomic arrangements using x-ray anomalous scattering; (c) dynamic small angle x-ray scattering; (d) x-ray lithography and microscopy; (e) the determination of surface electronic states using vacuum ultraviolet radiation; (f) time resolved fluorescence from protein molecules.
Keywords
Anodes; Atomic measurements; Electromagnetic scattering; Electromagnetic wave absorption; Electrons; Laboratories; Particle scattering; Synchrotron radiation; X-ray lithography; X-ray scattering;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1979.4330609
Filename
4330609
Link To Document