Title :
Magnetization estimation from MFM images
Author :
Hsu, Chi-Chun ; Miller, Clayton T. ; Indeck, Ronald S. ; Sullivan, Joseph A O ; Muller, Marcel W.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., St. Louis, MO, USA
fDate :
9/1/2002 12:00:00 AM
Abstract :
We have developed a method to estimate the complete magnetization in thin-film longitudinal recording media from magnetic force microscopy (MFM) data. The method uses a medium model described by a Voronoi tessellation of the film plane. The magnetization lies in that plane, has constant magnitude, and is uniform within each convex region, or grain, of the tessellation. The effect of a single grain on the MFM simulation is isolated by considering the difference between the MFM images before and after that grain undergoes a 180° magnetization reversal. Using this difference image, the complete magnetization of the grain and the grain´s boundaries are estimated. By isolating each grain in turn, as if a series of incremental applied fields had been applied, the magnetization for the whole pattern is estimated.
Keywords :
computational geometry; grain boundaries; magnetic force microscopy; magnetic recording; magnetic thin films; magnetisation reversal; Voronoi tessellation; complete magnetization; grain boundaries; image reconstruction; irrotational components; magnetic force microscopy images; magnetization reversal; medium model; micromagnetic models; single grain effect; solenoidal components; thin-film longitudinal recording media; Fourier transforms; Image reconstruction; Life estimation; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic recording; Magnetization reversal; Micromagnetics;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.803586