Uncertainty in the calibration of a photodiode-type power meter due to the spectral width of a light source

Author

Inoue, Takemi ; Yokoshima, Ichiro ; Katada, Fumio

Author_Institution

Electrotech. Lab., Ibaraki, Japan

Volume

38

Issue

2

fYear

1989

fDate

4/1/1989 12:00:00 AM

Firstpage

581

Lastpage

583

Abstract

The error due to the spectral width of a light source in the calibration of a photodiode-type power meter has been studied. Three types of photodiodes, namely, Si, Ge, and InGaAs, have been examined in the wavelength region 800-1650 nm. Theoretical calculations have shown that an error of more than 5% may arise with a Si or Ge photodiode in a specific wavelength region. The measured difference between two photodiode-type power meters agreed with the theoretically calculated value to 0.5%

Keywords

III-V semiconductors; calibration; elemental semiconductors; gallium arsenide; germanium; indium compounds; light sources; optical variables measurement; photodetectors; photodiodes; power measurement; silicon; 800 to 1650 nm; Ge; InGaAs; Si; calibration; light source; measurement error; photodiode-type power meter; spectral width; Calibration; Helium; Light sources; Optical fibers; Photodetectors; Photodiodes; Power measurement; Stability; Uncertainty; Wavelength measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.192352

Filename

192352