DocumentCode :
846140
Title :
Integrated silicon Schottky mixer diodes with cutoff frequencies above 1 THz
Author :
Morschbach, Michael ; Müller, Andreas ; Schöllhorn, Claus ; Oehme, Michael ; Buck, Thomas ; Kasper, Erich
Author_Institution :
Inst. of Semicond. Eng., Univ. of Stuttgart, Germany
Volume :
53
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
2013
Lastpage :
2018
Abstract :
In this paper, fully monolithic integrated Schottky diodes on a high-resistivity (HR) silicon substrate with cutoff frequencies above 1 THz are presented. As HR silicon substrate, a common float-zone substrate was used. The necessity of an optimized layer design will be discussed. As it will be shown, cutoff frequencies above 1 THz are possible even for large area diodes with an optimized layer design, which provides the so-called MOTT operation. The demands for the layer design to realize MOTT operation and the resulting advantages for the component will be discussed in detail. The used fabrication process, which combines two separate standard processes, is explained briefly. The results of the electrical measurements and the achieved cutoff frequency will be summarized. To demonstrate a monolithic integration, the presented Schottky diodes have been manufactured in a process wherein RF microelectromechanical systems switches have been successfully produced. As a key application, a subharmonic mixer, with a 24-GHz RF signal and a 12-GHz local-oscillator signal, will be discussed.
Keywords :
MMIC mixers; Schottky diode mixers; elemental semiconductors; microwave diodes; silicon; 12 GHz; 24 GHz; MMIC; MOTT operation; RF microelectromechanical systems; RF signal; cutoff frequency; electrical measurements; float-zone substrate; high-resistivity silicon substrate; integrated silicon Schottky mixer diodes; local-oscillator signal; monolithic integrated Schottky diodes; monolithic integration; short distance radar; subharmonic mixer; Cutoff frequency; Design optimization; Electric variables measurement; Fabrication; Frequency measurement; Manufacturing processes; Monolithic integrated circuits; Radiofrequency microelectromechanical systems; Schottky diodes; Silicon; 24-GHz mixer; Cutoff frequency; MOTT operation; Schottky diode; high-resistivity (HR) substrate; integrated; monolithic; short distance radar; silicon;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2005.848831
Filename :
1440718
Link To Document :
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