• DocumentCode
    846235
  • Title

    Extraction of nonlinear parameters of dispersive avalanche photodiode using pulsed RF measurement and quasi-DC optical excitation

  • Author

    Ghose, Abhijit ; Bunz, Bernd ; Weide, Jürgen ; Kompa, Günter

  • Author_Institution
    Dept. of High Frequency Eng., Univ. of Kassel, Germany
  • Volume
    53
  • Issue
    6
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    2082
  • Lastpage
    2087
  • Abstract
    A measurement system using a pulsed RF signal is presented for extraction of nonlinear parameters of a large-signal model (LSM) of a dispersive avalanche photodiode. Nonlinear model of the avalanche photodiode was considered as two-port network and vector reflection measurement was carried out using a microwave transition analyzer in pulsed RF mode in conjunction with synchronized pulsed optical stimulus on the photodiode. Square-wave optical stimulus of 5-μs width (full width at half maximum) and 5-kHz pulse-repetition frequency (quasi-dc) were synchronized with the pulsed RF excitation using a synchronization circuit. High-frequency dispersion effects were taken into consideration for deriving the current through the photodiode and the theoretical background was given for the derivation of optical and bias-dependent parameters. Nonlinear parameters of LSM of the avalanche photodiode were extracted from the small-signal vector reflection measurement at different bias points and optical conditions. Thermal impedance of the device limits the continuous-wave measurement up to 0.1 mW of optical power, whereas when using the current method, it was possible to characterize the device up to 1.3 mW of peak optical power.
  • Keywords
    S-parameters; avalanche photodiodes; pulse measurement; semiconductor device models; two-port networks; 5 kHz; bias-dependent parameters; continuous-wave measurement; dispersive avalanche photodiode; high-frequency dispersion effects; large-signal model; measurement system; microwave transition analyzer; nonlinear parameter extraction; optical parameters; optical power; pulse measurement; pulse-repetition frequency; pulsed RF excitation; pulsed RF measurement; pulsed RF mode; pulsed RF signal; quasi-DC optical excitation; reflection coefficient measurement; scattering parameters; small-signal vector reflection measurement; square-wave optical stimulus; synchronization circuit; synchronized pulsed optical stimulus; thermal impedance; two-port network; Avalanche photodiodes; Dispersion; Frequency synchronization; Nonlinear optical devices; Nonlinear optics; Optical pulses; Optical reflection; Pulse circuits; Pulse measurements; Radio frequency; Nonlinearities; pulse measurement; reflection coefficient measurement; scattering parameters;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.848808
  • Filename
    1440726