• DocumentCode
    846268
  • Title

    The singularity expansion method and its application to target identification

  • Author

    Baum, Carl E. ; Rothwell, Edward J. ; Chen, Kun-Mu ; Nyquist, Dennis P.

  • Author_Institution
    Phillips Lab., Kirtland AFB, NM, USA
  • Volume
    79
  • Issue
    10
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    1481
  • Lastpage
    1492
  • Abstract
    The singularity expansion method (SEM) for quantifying the transient electromagnetic (EM) scattering from targets illuminated by pulsed EM radiation is reviewed. SEM representations for both induced currents and scattered fields are presented. Natural-resonance-based target identification schemes, based upon the SEM, are described. Various techniques for the extraction of natural-resonance modes from measured transient response waveforms are reviewed. Particular attention is given to the aspect-independent (extinction) E-pulse and (single-mode) S-pulse discriminant waveforms which, when convolved with the late-time pulse response of a matched target, produce null or mono-mode responses, respectively, through natural-mode annihilation. Extensive experiment results for practical target models are included to validate the E-pulse target discrimination technique. Finally, anticipated future extensions and areas requiring additional research are identified
  • Keywords
    electromagnetic wave scattering; radar theory; reviews; aspect independent extinction E-pulse; induced currents; late-time pulse response; matched target; mono-mode responses; natural resonance based target identification; natural-mode annihilation; natural-resonance modes; null mode response; pulsed EM radiation; scattered fields; single mode S-pulse discriminant waveforms; singularity expansion method; target identification; transient EM scattering; transient response waveforms; Current density; EMP radiation effects; Electromagnetic scattering; Electromagnetic transients; Frequency; Integral equations; Light scattering; Numerical analysis; Resonance; Scattering parameters;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.104223
  • Filename
    104223