DocumentCode :
846268
Title :
The singularity expansion method and its application to target identification
Author :
Baum, Carl E. ; Rothwell, Edward J. ; Chen, Kun-Mu ; Nyquist, Dennis P.
Author_Institution :
Phillips Lab., Kirtland AFB, NM, USA
Volume :
79
Issue :
10
fYear :
1991
fDate :
10/1/1991 12:00:00 AM
Firstpage :
1481
Lastpage :
1492
Abstract :
The singularity expansion method (SEM) for quantifying the transient electromagnetic (EM) scattering from targets illuminated by pulsed EM radiation is reviewed. SEM representations for both induced currents and scattered fields are presented. Natural-resonance-based target identification schemes, based upon the SEM, are described. Various techniques for the extraction of natural-resonance modes from measured transient response waveforms are reviewed. Particular attention is given to the aspect-independent (extinction) E-pulse and (single-mode) S-pulse discriminant waveforms which, when convolved with the late-time pulse response of a matched target, produce null or mono-mode responses, respectively, through natural-mode annihilation. Extensive experiment results for practical target models are included to validate the E-pulse target discrimination technique. Finally, anticipated future extensions and areas requiring additional research are identified
Keywords :
electromagnetic wave scattering; radar theory; reviews; aspect independent extinction E-pulse; induced currents; late-time pulse response; matched target; mono-mode responses; natural resonance based target identification; natural-mode annihilation; natural-resonance modes; null mode response; pulsed EM radiation; scattered fields; single mode S-pulse discriminant waveforms; singularity expansion method; target identification; transient EM scattering; transient response waveforms; Current density; EMP radiation effects; Electromagnetic scattering; Electromagnetic transients; Frequency; Integral equations; Light scattering; Numerical analysis; Resonance; Scattering parameters;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.104223
Filename :
104223
Link To Document :
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