Title :
Optimal diagnostic methods for wiring interconnects
Author :
Cheng, Wu-Tung ; Lewandowski, James L. ; Wu, Eleanor
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
fDate :
9/1/1992 12:00:00 AM
Abstract :
The problem of generating minimum test sets for diagnosing faults in wiring interconnects on printed circuit boards is addressed. It is assumed that all the nets can be accessed in parallel or through a boundary-scan chain on the board. The fault model includes multiple stuck-at-hand faults. Three methods for three different diagnosis mechanisms are presented. All the diagnostic methods can be further improved by taking advantage of the structural information of wiring interconnects
Keywords :
boundary scan testing; fault location; printed circuit testing; wiring; boundary-scan chain; diagnosis mechanisms; faults; minimum test sets; multiple stuck-at-hand faults; printed circuit boards; structural information; wiring interconnects; Circuit faults; Circuit testing; Design automation; Electrical fault detection; Fault detection; Helium; Integrated circuit interconnections; Printed circuits; Routing; Wiring;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
