Title :
High temperature tests of ACSR conductor hardware
Author :
Jakubiak, E.A. ; Matrusz, J.S.
Author_Institution :
Detroit Edison Co., MI, USA
fDate :
1/1/1989 12:00:00 AM
Abstract :
Hardware temperature data obtained by laboratory tests of four common ACSR conductors are reported. A summary of the temperature data and linear equations and graphs relating conductor and hardware temperatures are included. Some conductor loss of strength data from laboratory tests are also reported. This study indicates that the line hardware can operate safely up to conductor temperatures of 200°C
Keywords :
conductors (electric); temperature measurement; 200 degC; ACSR conductors; high temperature tests; Aluminum; Capacitive sensors; Clamps; Conductors; Hardware; Laboratories; Shock absorbers; System testing; Temperature distribution; Thermal conductivity;
Journal_Title :
Power Delivery, IEEE Transactions on
