Title :
Fabrication and Characterization of Temperature Insensitive 660-nm Resonant-Cavity LEDs
Author :
Chen, Jun-Rong ; Ko, Tsung-Shine ; Lu, Tien-Chang ; Chang, Yi-An ; Kuo, Hao-Chung ; Yen-Kuang Kuo ; Tsai, Jui-Yen ; Laih, Li-Wen ; Wang, Shing-Chung
Author_Institution :
Dept. of Photonics & Inst. of Electro-Opt. Eng., Nat. Chiao Tung Univ., Hsinchu
fDate :
7/1/2008 12:00:00 AM
Abstract :
InGaP/AlGaInP 660-nm resonant-cavity light-emitting diodes (RCLEDs) with stable temperature characteristics have been achieved by extending the resonant cavity length from one optical wavelength (1 lambda) to three optical wavelengths (3 lambda) and tripling the number of quantum wells. When the operation temperature increases from 25degC to 95degC, the degree of power variation at 20 mA is reduced from -2.1 dB to -0.6 dB for the conventional 1- lambda cavity RCLEDs and 3- lambda cavity RCLEDs, respectively. In order to interpret the temperature-dependent experimental results, advanced device simulation is applied to model the RCLEDs with different cavity designs. According to the numerical simulation results, we deduce that the stable temperature-dependent output performance should originate from the reduction of electron leakage current and thermally enhanced hole transport for the 3- lambda cavity AlGaInP RCLEDs.
Keywords :
III-V semiconductors; aluminium compounds; indium compounds; leakage currents; light emitting diodes; quantum well devices; transport processes; InGaP-AlGaInP; current 20 mA; electron leakage current; light-emitting diodes; quantum wells; resonant-cavity LED; temperature 25 C; temperature 95 C; temperature insensitive LED; thermally enhanced hole transport; wavelength 660 nm; Fabrication; Light emitting diodes; Optical attenuators; Optical fibers; Optical interconnections; Optical modulation; Performance gain; Plastics; Resonance; Temperature; Leakage current; modeling; polymethyl methacrylate plastic optic fiber (POF); resonant-cavity light-emitting diode (RCLED); semiconductor device;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2008.920639