Title :
Controlling the magneto-transport properties of EuS thin films
Author :
Keller, J. ; Parker, J.S. ; Stankiewicz, J. ; Read, D.E. ; Stampe, P.A. ; Kennedy, R.J. ; Xiong, P. ; Von Molnár, S.
Author_Institution :
2. Phys. Inst., Aachen, Germany
fDate :
9/1/2002 12:00:00 AM
Abstract :
The growth of thin films of the ferromagnetic semiconductor EuS on [100] oriented GaAs substrates by electron-beam evaporation is demonstrated. Structural characterization by X-ray diffraction reveals [100] oriented growth. In general, the magnetic and transport properties can strongly be influenced by the deposition parameters. We systematically investigate the influence of the growth temperature TS in the range TS=235 K-675 K on the above properties. The Curie temperature increases with decreasing growth temperature, while the magnetic transition becomes broader. The resistivity decreases over four orders of magnitude with decreasing substrate temperature. The behavior of the magnetic properties and the resistivity can be explained by a change in stoichiometry, leading to higher carrier concentrations for lower substrate temperatures. Hall-effect measurements, magnetoresistance, and temperature dependence of the resistivity show a qualitative behavior known from bulk EuS samples. The demonstrated tunability of the magnetic and transport properties opens a wide range of possible applications for EuS in spin-electronics.
Keywords :
Curie temperature; Hall effect; X-ray diffraction; carrier density; electrical resistivity; electron beam deposition; europium compounds; ferromagnetic materials; magnetic semiconductors; magnetic thin films; magnetic transitions; magnetoresistance; semiconductor thin films; stoichiometry; 235 to 675 K; Curie temperature; EuS; EuS thin film; GaAs; GaAs substrate; Hall effect; X-ray diffraction; carrier concentration; electrical resistivity; electron beam evaporation; ferromagnetic semiconductor; growth temperature; magnetic properties; magnetic transition; magnetoresistance; magnetotransport properties; spin electronics; stoichiometry; structural characteristics; substrate temperature; temperature dependence; transport properties; Conductivity; Gallium arsenide; Magnetic properties; Magnetic semiconductors; Semiconductor thin films; Substrates; Temperature distribution; Temperature measurement; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.801977