Title :
Influence of electrode structure on magnetotransport in magnetic tunnel junctions
Author :
Wieldraaijer, H. ; LeClair, P. ; Kohlhepp, J.T. ; Swagten, H.J.M. ; de Jonge, W.J.M.
Author_Institution :
Dept. of Appl. Phys., Eindhoven Univ. of Technol., Netherlands
fDate :
9/1/2002 12:00:00 AM
Abstract :
The physical structure of the magnetic electrodes of Co-Al2O3-Co magnetic tunnel junctions has been investigated by. means of 59Co nuclear magnetic resonance and X-ray diffraction. Junctions sputtered on FeMn have an essentially fcc [111]-oriented bottom electrode, while all top electrodes and the bottom electrodes of junctions sputtered on Ta are polyphase and polycrystalline. The specifics of the electronic structure of the electrode crystal phases can explain the extra features and asymmetry in the conductance-versus-bias behavior observed in FeMn-based junctions.
Keywords :
MIM structures; X-ray diffraction; aluminium compounds; cobalt; electrodes; ferromagnetic materials; giant magnetoresistance; magnetic multilayers; nuclear magnetic resonance; sputtered coatings; tunnelling; Co-Al2O3-Co; X-ray diffraction; differential junction conductances; electrode structure influence; ferromagnetic junctions; hyperfine fields; magnetic electrodes; magnetic tunnel junctions; magnetotransport; nuclear magnetic resonance; sputtered electrodes; stacking-fault phases; Amorphous magnetic materials; Atomic measurements; Electrodes; Helium; Magnetic analysis; Magnetic resonance; Magnetic tunneling; Nuclear electronics; Nuclear magnetic resonance; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.803162
