• DocumentCode
    847649
  • Title

    Thermally activated reversal in exchange-coupled structures

  • Author

    Wang, Y.G. ; Petford-Long, A.K. ; Laidler, H. ; O´Grady, K. ; Kief, M.T.

  • Author_Institution
    Dept. of Mater., Oxford Univ., UK
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2773
  • Lastpage
    2775
  • Abstract
    In this paper, we study the thermally activated reversal of IrMn/CoFe exchange-coupled structures using Lorentz microscopy and magnetometry. An asymmetry and a training effect were found on the hysteresis loops both with and without holding the film at negative saturation of the ferromagnetic layer. Holding the film at negative saturation results in the hysteresis loop shifting toward zero field. We believe that, in this system, two energy barrier distributions with different time constants coexist. The large-time-constant thermally activated reversal of the antiferromagnetic layer contributes to a increasing shift of the entire hysteresis loop toward zero field with increased period of time spent at negative saturation of the ferromagnetic layer. The small-time-constant thermal activation contributes to asymmetry in the magnetization reversal and training effects.
  • Keywords
    cobalt alloys; coercive force; exchange interactions (electron); interface magnetism; iridium alloys; iron alloys; magnetic hysteresis; magnetisation reversal; manganese alloys; transmission electron microscopy; IrMn-CoFe; IrMn/CoFe exchange-coupled structures; Lorentz transmission electron microscopy; antiferromagnetic layer; coercivity; energy barrier distributions; ferromagnetic layer; hysteresis loop asymmetry; hysteresis loop shift; hysteresis loop training effect; large-time-constant thermally activated reversal; magnetization reversal asymmetry; magnetometry; negative saturation; small-time-constant thermal activation; thermally activated reversal; time constants; Antiferromagnetic materials; Atomic force microscopy; Electrons; Energy barrier; Magnetic films; Magnetic force microscopy; Magnetic hysteresis; Magnetization reversal; Saturation magnetization; Semiconductor films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.803158
  • Filename
    1042353