DocumentCode
847663
Title
Fault-Tolerant Techniques for Radiation Environments
Author
DeVries, Ronald C.
Volume
26
Issue
3
fYear
1979
fDate
6/1/1979 12:00:00 AM
Firstpage
4320
Lastpage
4326
Abstract
This paper reports on a study made on the use of fault-tolerant systems in radiation environments for radiation hardening and hardness assurance purposes. The fault-tolerant systems studied in depthare TMR, TMR/Simplex, Switching Redundancy, Self-Purging Redundancy, and Radial Logic. Failure distributions were obtained for a number of components and for various radiation environments. These were used to graph radiation related indicators as a function of radiation level. One indicator relates to radiation hardness and a second relates to hardness assurance. The effects of imperfect switches and voters and of system size and system sectioning were considered. Finally, the chosen systems were ranked with respect to radiation hardness and hardness assurance.
Keywords
Circuit faults; EMP radiation effects; Electromagnetic radiation; Fault tolerance; Fault tolerant systems; Large scale integration; Radiation hardening; Redundancy; Stress; Switches;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1979.4330777
Filename
4330777
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