• DocumentCode
    847663
  • Title

    Fault-Tolerant Techniques for Radiation Environments

  • Author

    DeVries, Ronald C.

  • Volume
    26
  • Issue
    3
  • fYear
    1979
  • fDate
    6/1/1979 12:00:00 AM
  • Firstpage
    4320
  • Lastpage
    4326
  • Abstract
    This paper reports on a study made on the use of fault-tolerant systems in radiation environments for radiation hardening and hardness assurance purposes. The fault-tolerant systems studied in depthare TMR, TMR/Simplex, Switching Redundancy, Self-Purging Redundancy, and Radial Logic. Failure distributions were obtained for a number of components and for various radiation environments. These were used to graph radiation related indicators as a function of radiation level. One indicator relates to radiation hardness and a second relates to hardness assurance. The effects of imperfect switches and voters and of system size and system sectioning were considered. Finally, the chosen systems were ranked with respect to radiation hardness and hardness assurance.
  • Keywords
    Circuit faults; EMP radiation effects; Electromagnetic radiation; Fault tolerance; Fault tolerant systems; Large scale integration; Radiation hardening; Redundancy; Stress; Switches;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1979.4330777
  • Filename
    4330777