Title :
Characterization and deblurring of lateral crosstalk in CMOS image sensors
Author :
Lee, Ji Soo ; Shah, Joey ; Jernigan, M. Ed ; Hornsey, Richard I.
Author_Institution :
Micron Imaging, Boise, ID, USA
Abstract :
Lateral crosstalk in CMOS imaging arrays deter effective utilization of small pixel sizes (e.g., < 5.0 μm × 5.0 μm) now permitted by technology scaling. A simple measurement setup for empirical characterization of lateral crosstalk in CMOS image sensors is presented. A demonstration of deblurring operations based on the obtained blur model of lateral crosstalk is also provided. Several well-known linear deconvolution filters are employed in the demonstration. The tradeoffs in sharpness restoration, high-frequency noise amplification, and the intensity clipping effect in the design of linear deblurring operation for the application of lateral crosstalk are illustrated.
Keywords :
CMOS image sensors; crosstalk; deconvolution; image restoration; CMOS image sensors; blur model; cross-responsivity; deblurring operations; empirical characterization; high-frequency noise amplification; intensity clipping effect; inverse filtering; lateral crosstalk; linear deblurring; sharpness restoration; CMOS image sensors; CMOS technology; Crosstalk; Deconvolution; Nonlinear filters; Optical arrays; Optical design; Optical imaging; Pixel; Semiconductor device modeling;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2003.819246
