Characterization and deblurring of lateral crosstalk in CMOS image sensors

Author

Lee, Ji Soo ; Shah, Joey ; Jernigan, M. Ed ; Hornsey, Richard I.

Author_Institution

Micron Imaging, Boise, ID, USA

Volume

50

Issue

12

fYear

2003

Firstpage

2361

Lastpage

2368

Abstract

Lateral crosstalk in CMOS imaging arrays deter effective utilization of small pixel sizes (e.g., < 5.0 μm × 5.0 μm) now permitted by technology scaling. A simple measurement setup for empirical characterization of lateral crosstalk in CMOS image sensors is presented. A demonstration of deblurring operations based on the obtained blur model of lateral crosstalk is also provided. Several well-known linear deconvolution filters are employed in the demonstration. The tradeoffs in sharpness restoration, high-frequency noise amplification, and the intensity clipping effect in the design of linear deblurring operation for the application of lateral crosstalk are illustrated.

Keywords

CMOS image sensors; crosstalk; deconvolution; image restoration; CMOS image sensors; blur model; cross-responsivity; deblurring operations; empirical characterization; high-frequency noise amplification; intensity clipping effect; inverse filtering; lateral crosstalk; linear deblurring; sharpness restoration; CMOS image sensors; CMOS technology; Crosstalk; Deconvolution; Nonlinear filters; Optical arrays; Optical design; Optical imaging; Pixel; Semiconductor device modeling;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2003.819246

Filename

1255597