Title :
Magnetic properties of various martensitic phases in Ni-Mn-Ga alloy
Author :
Straka, Ladislav ; Heczko, Oleg ; Lanska, Nataliya
Author_Institution :
Dept. of Eng. Phys. & Math., Helsinki Univ. of Technol., Espoo, Finland
fDate :
9/1/2002 12:00:00 AM
Abstract :
Single crystalline Ni48.7Mn29.1Ga22.2 sample was studied in the temperature range 110 K-425 K. Magnetic properties of four different structure phases were measured at different temperatures. The magnetic anisotropies of the different phases were determined from magnetization curves. At room temperature, the structure is five-layered modulated tetragonal martensite with c/a<1 and uniaxial anisotropy Ku1=1.6×105 J.m-3. Below 251 K, the structure is orthorhombic c5 J.m-3 between c and a. At 218 K, the orthorhombic phase transforms to the tetragonal phase with c/a>1. A single variant of low-temperature martensite was obtained by cooling in magnetic field 1.4 T. At 173 K, the sum of magnetic anisotropy constants is K1+K2=1.5×105 J.m-3 assuming an easy-plane magnetic anisotropy.
Keywords :
cooling; ferromagnetic materials; gallium alloys; magnetic anisotropy; magnetisation; manganese alloys; martensitic transformations; nickel alloys; shape memory effects; 1.4 T; 110 to 425 K; Ni-Mn-Ga alloy; Ni48.7Mn29.1Ga22.2; cooling; easy magnetization axis; easy-plane magnetic anisotropy; five-layered modulated tetragonal martensite; giant field induced strain; low-temperature martensite; magnetic anisotropies; magnetic anisotropy constants; magnetic anisotropy energy; magnetic properties; magnetic shape memory effect; magnetization curves; martensitic phases; orthorhombic phase; orthorhombic structure; room temperature; single crystalline Ni48.7Mn29.1Ga22.2 sample; structure phases; temperature range; tetragonal phase; uniaxial anisotropy; Anisotropic magnetoresistance; Cooling; Crystallization; Magnetic anisotropy; Magnetic fields; Magnetic properties; Magnetization; Phase measurement; Temperature distribution; Temperature measurement;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.802469