DocumentCode
848150
Title
A new negative-resistance device
Author
Geppert, D.V.
Volume
51
Issue
1
fYear
1963
Firstpage
223
Lastpage
223
Keywords
Capacitance measurement; Circuit testing; Current-voltage characteristics; Frequency; Niobium; Oscilloscopes; Probes; Semiconductor diodes; Strips; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1963.1689
Filename
1443619
Link To Document