Non-Destructive Thickness Measurement Using Quasi-Static Resonators

Author

Boybay, Muhammed S. ; Ramahi, Omar M.

Author_Institution

Dept. of Comput. Eng., Antalya Int. Univ., Antalya, Turkey

Volume

23

Issue

4

fYear

2013

fDate

Apr-13

Firstpage

217

Lastpage

219

Abstract

A microwave sensor for non-destructive measurement of dielectric thickness is presented. The sensor is a quasi-static resonator and based on complementary split ring resonator (CSRR) structure. When the CSRR structure is backed by a conductive medium covered with a dielectric layer the resonance frequency of the CSRR has a strong dependence on the thickness of the dielectric layer. Effect of the size of CSRR sensor on the sensitivity is analyzed numerically. For experimental verification, a CSRR sensor that operates in the 1.6 to 2.3 GHz band is fabricated and excited by a microstrip line.

Keywords

dielectric measurement; microstrip lines; microwave detectors; microwave resonators; thickness measurement; CSRR structure; complementary split ring res- onator structure; dielectric layer; dielectric thickness; frequency 1.6 GHz to 2.3 GHz; microstrip line; microwave sensor; nondestructive thickness measurement; quasistatic resonators; Dielectrics; Microwave measurements; Paints; Resonant frequency; Sensitivity; Thickness measurement; Transmission line measurements; Complementary split ring resonators (CSRRs); near field sensors; thickness measurement;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2013.2249056

Filename

6476035