Title : 
Corrections to “Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction” [Mar 15 534-543]
         
        
            Author : 
Joshi, Rajiv V. ; Kanj, Rouwaida
         
        
            Author_Institution : 
, IBM T. J. Watson Laboratories, Yorktown Heights, NY, USA
         
        
        
        
        
        
        
        
            Abstract : 
On [1, p. 536], Section II-A, second paragraph, lines 5–8, [2] should be used instead of [1] and the correct statement is as follows. “Model-to-hardware corroboration shows an excellent matching between importance-sampling-based methods yield estimation [2] and the true hardware yield. We therefore adopt the methodology in [2] as the core statistical engine for our TfM methodology.”
         
        
            Keywords : 
Capacitance; FinFETs; Mixed analog digital integrated circuits; SRAM chips; Statistical analysis; Yield estimation;
         
        
        
            Journal_Title : 
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TVLSI.2015.2429293