• DocumentCode
    848661
  • Title

    Determining the injection efficiency of metal-semiconductor contacts

  • Author

    Lindmayer, J. ; Wrigley, C.

  • Author_Institution
    Sprague Electric Co., North Adams, Mass.
  • Volume
    51
  • Issue
    1
  • fYear
    1963
  • Firstpage
    256
  • Lastpage
    256
  • Keywords
    Admittance measurement; Capacitance measurement; Charge carrier lifetime; Charge carrier processes; Conductors; Crystals; Current measurement; Electron devices; Semiconductor diodes;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.1737
  • Filename
    1443667
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=848661