DocumentCode :
848707
Title :
Transport effects and characteristic modes in the modeling and simulation of submicron devices
Author :
Jerome, Joseph W. ; Shu, Chi-Wang
Author_Institution :
Dept. of Math., Northwestern Univ., Evanston, IL, USA
Volume :
14
Issue :
8
fYear :
1995
fDate :
8/1/1995 12:00:00 AM
Firstpage :
917
Lastpage :
923
Abstract :
This paper has two major goals: (1) to study the effect of the common practice of neglecting the convective terms (inertial approximation) in the hydrodynamic model in the simulation of n+ -n-n+ diodes and two dimensional MESFET devices; and (2) to test analytical criteria, formulated in terms of characteristic values of the Jacobian matrix, as a method of determining the impact of first derivative perturbation terms in this model, and in related energy transport models. This characteristic value analysis can be thought of as generalizing the usual analytical solution of first order linear systems of ordinary differential equations with constant coefficients. Concerning (1), we find that the inertial approximation is invalid near the diode junctions, and near the contact regions of the MESFET device. In regard to (2), we find a proper arrangement of terms, expressing the flux, such that the first derivative part of the system is hyperbolic, both for the hydrodynamic model and the energy transport model. For the hydrodynamic model, two forms of the heat conduction term are studied, including the case of a convective term. This suggests and validates the use of shock capturing algorithms for the simulation
Keywords :
Jacobian matrices; Schottky gate field effect transistors; heat conduction; perturbation techniques; semiconductor device models; semiconductor diodes; Jacobian matrix; characteristic modes; characteristic value analysis; characteristic values; convective terms; energy transport models; first derivative perturbation terms; first order linear systems; heat conduction term; hydrodynamic model; inertial approximation; n+-n-n+ diodes; ordinary differential equations; shock capturing algorithms; submicron devices; transport effects; two dimensional MESFET devices; Differential equations; Diodes; Electric shock; High definition video; Hydrodynamics; Jacobian matrices; Linear systems; MESFETs; Mathematics; Modems;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.402490
Filename :
402490
Link To Document :
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