• DocumentCode
    849027
  • Title

    An NMOS input merged bipolar/sidewall-MOS transistor with a bypass sidewall MOS transistor (NBiBMOS transistor)

  • Author

    O, Kenneth K. ; Lutsky, Joseph J. ; Reif, Rafael L. ; Lee, Hae-Seung

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    13
  • Issue
    11
  • fYear
    1992
  • Firstpage
    563
  • Lastpage
    565
  • Abstract
    The concept of merging a vertical n-p-n bipolar and two sidewall NMOS transistors into an NMOS input merged bipolar/sidewall-MOS transistor with a bypass sidewall NMOS transistor structure (NBiBMOS transistor) is described. The output current of this structure, unlike that of NBiMOS transistors, is significant even when the output voltage (V/sub CE/ or V/sub DE/) is less than the turn-on voltage of the n-p-n bipolar transistor (V/sub BE/= approximately 0.8 V). This structure, when used in BiCMOS logic gates, will allow the output voltage to swing all the way to 0.0 V rather than to 0.8 V. The feasibility of this concept was demonstrated by fabricating and DC characterizing the NBiBMOS transistor structures, which occupy approximately 1.2 times the area of a single n-p-n bipolar transistor. The NBiBMOS transistor has a higher drive capability than that of a structure consisting of an NBiMOS and a separate bypass transistor, because the body-source junction of the bypass NMOS transistor is forward biased.<>
  • Keywords
    bipolar transistors; insulated gate bipolar transistors; insulated gate field effect transistors; 0.8 V; BiCMOS logic gates; NBiBMOS transistor; NMOS input merged bipolar/sidewall-MOS transistor; body-source junction; bypass sidewall NMOS transistor; drive capability; forward bias; output current; output voltage; vertical n-p-n bipolar transistor; BiCMOS integrated circuits; Bipolar transistor circuits; Bipolar transistors; Fabrication; Logic circuits; Logic gates; MOS devices; MOSFETs; Merging; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.192840
  • Filename
    192840