DocumentCode :
849303
Title :
Noise measurements in field-effect transistors
Author :
Bruncke, W.C.
Volume :
51
Issue :
2
fYear :
1963
Firstpage :
378
Lastpage :
379
Keywords :
Capacitance; Circuits; Diodes; FETs; Frequency; Impedance; Noise measurement; Radiofrequency amplifiers; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.1795
Filename :
1443725
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=849303
