• DocumentCode
    849744
  • Title

    Microwave Modeling and Parameter Extraction Method for Quantum-Well Lasers

  • Author

    Gao, Jianjun

  • Author_Institution
    Sch. of Inf. Sci. & Technol., East China Normal Univ., Shanghai
  • Volume
    26
  • Issue
    14
  • fYear
    2008
  • fDate
    7/15/2008 12:00:00 AM
  • Firstpage
    2245
  • Lastpage
    2250
  • Abstract
    Accurate modeling and efficient parameter extraction of the microwave equivalent circuit model of high-speed quantum- well lasers for high-frequency operation based on the rate equations are presented in this paper. The model takes into account the intrinsic nonlinear behavior of the device, the effect of hetero- junction, and the parasitic elements due to the various levels of the packaging hierarchy to ensure a realistic representation of the input of the quantum-well lasers. The model is versatile in that it permits dc, small signal, and large signal to be performed. A direct extraction method to determine the extrinsic and intrinsic model parameters for laser diode by using a set of closed-form expressions based on the dc, input reflection coefficients, and modulation responses on wafer measurement is given also. Simulated and measured results for the dc, input reflection coefficients, and modulation responses exhibit good agreement over a wide range of bias points.
  • Keywords
    equivalent circuits; high-speed optical techniques; nonlinear optics; quantum well lasers; direct extraction; high-frequency operation; high-speed quantum-well lasers; intrinsic nonlinear behavior; laser diode; microwave equivalent circuit; parameter extraction; wafer measurement; Equivalent circuits; Laser modes; Masers; Microwave devices; Microwave theory and techniques; Nonlinear equations; Optical reflection; Parameter extraction; Quantum well lasers; Semiconductor device modeling; Laser diode; modeling; parameter extraction; quantum well; rate equation;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.919455
  • Filename
    4609985