DocumentCode :
849984
Title :
Improvement of Lock-in Electrical Bio-Impedance Analyzer for Implantable Medical Devices
Author :
Min, Mart ; Parve, Toomas
Author_Institution :
Tallinn Univ. of Technol.
Volume :
56
Issue :
3
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
968
Lastpage :
974
Abstract :
A novel solution for improving lock-in electrical bio-impedance (EBI) analyzers by suppressing errors caused by higher odd harmonics of rectangular wave pulses is proposed. The solution is based on a newly developed method of shortening the rectangular full duty cycle pulses, which are commonly used in correlation-type lock-in EBI measurements. Comparison of the proposed method to a common method of regular rectangular waveforms is given. The results show that the measurement errors of the three-element EBI equivalent become several tens of times smaller when shortening the excitation and reference signals separately by different values, for example, by 30 deg and 18deg. Shortening of only a single signal (either excitation or reference) can also give significant progress. Improved accuracy of the EBI phasor measurement makes the proposed method reliable for most clinical applications. Due to its simplicity, the method is appropriate for on-chip realization in implantable devices
Keywords :
bioelectric phenomena; electric impedance measurement; measurement errors; phase measurement; prosthetics; EBI phasor measurement; implantable medical devices; lock-in EBI measurements; lock-in electrical bioimpedance analyzer; measurement errors; odd harmonics; rectangular wave pulses; Admittance measurement; Electric resistance; Equivalent circuits; Extracellular; Frequency measurement; Harmonic analysis; Immune system; Impedance measurement; Implantable biomedical devices; Pulse measurements; Complex bio-impedance; impedance measurement; implantable devices; pulse wave signals; suppression of higher harmonics; synchronous demodulation;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.894172
Filename :
4201009
Link To Document :
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