Title :
Radiation Testing of Recent Vintage 8080A Microprocessors from Several Manufacturers
Author :
Martin, Richard L.
Author_Institution :
Electrical Engineering Department U. S. Naval Academy Annapolis, MD 21402
Abstract :
A novel radiation experiment was performed using recent vintage 8080A microprocessors from several manufacturers. Functional self tests were continuously monitored during irradiation. Total dose failure levels as well as implications of dose rate dependency and mode of failure are noted.
Keywords :
Automatic testing; Condition monitoring; Current measurement; Current supplies; Laboratories; Manufacturing; Microprocessors; Production; Propagation delay; Switches;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1980.4331015
