Title :
A Study of the Error in a Neutron Probability of Survival Formula
Author :
Eisen, Harvey ; Schoonmaker, David
Author_Institution :
Harry Diamond Laboratories Adelphi, Maryland 20783
Abstract :
The error associated with a widely used transistor neutron probability of survival formula has been assesed. The probability of survival prediction for three transistor types was compared with the actual fraction of transistors whose gain remained above a selected limit at each of several fluence levels. The agreement was very good, suggesting that the formulation used does not introduce excessive conservatism into the calculation.
Keywords :
Accuracy; Circuit testing; Equations; Hardware design languages; Laboratories; Manufacturing; Neutrons; Probability distribution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1980.4331023
