DocumentCode
850162
Title
A Study of the Error in a Neutron Probability of Survival Formula
Author
Eisen, Harvey ; Schoonmaker, David
Author_Institution
Harry Diamond Laboratories Adelphi, Maryland 20783
Volume
27
Issue
5
fYear
1980
Firstpage
1355
Lastpage
1358
Abstract
The error associated with a widely used transistor neutron probability of survival formula has been assesed. The probability of survival prediction for three transistor types was compared with the actual fraction of transistors whose gain remained above a selected limit at each of several fluence levels. The agreement was very good, suggesting that the formulation used does not introduce excessive conservatism into the calculation.
Keywords
Accuracy; Circuit testing; Equations; Hardware design languages; Laboratories; Manufacturing; Neutrons; Probability distribution;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1980.4331023
Filename
4331023
Link To Document