DocumentCode

850318

Title

On the measurement of minority carrier lifetime in p-n junctions

Author

Lee, S.C. ; Melehy, M.A.

Volume

51

Issue

3

fYear

1963

fDate

3/1/1963 12:00:00 AM

Firstpage

501

Lastpage

502

Keywords

Capacitors; Charge carrier lifetime; Circuits; Crystals; Density measurement; Germanium; P-n junctions; Semiconductor diodes; Spontaneous emission; Voltage;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1963.1892

Filename

1443822