Title :
A Study of Single Event Upsets in Static RAMS´s
Author :
Price, W.E. ; Nichols, D.K. ; Soliman, K.A.
Author_Institution :
California Institute of Technology Jet Propulsion Laboratory 4800 Oak Grove Dr. Pasadena, California 91103
Keywords :
Calibration; DRAM chips; Laboratories; Microcomputers; Neutrons; Particle beams; Protons; Single event upset; Testing; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1980.4331060
