DocumentCode

850531

Title

A Study of Single Event Upsets in Static RAMS´s

Author

Price, W.E. ; Nichols, D.K. ; Soliman, K.A.

Author_Institution

California Institute of Technology Jet Propulsion Laboratory 4800 Oak Grove Dr. Pasadena, California 91103

Volume

27

Issue

6

fYear

1980

Firstpage

1506

Lastpage

1508

Keywords

Calibration; DRAM chips; Laboratories; Microcomputers; Neutrons; Particle beams; Protons; Single event upset; Testing; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1980.4331060

Filename

4331060