Session 7 Analytical and statistical techniques in reliability analysis
Author :
Koppenhaver, J.T.
Author_Institution :
NASA, Washington, D.C.
Volume :
51
Issue :
3
fYear :
1963
fDate :
3/1/1963 12:00:00 AM
Firstpage :
508
Lastpage :
508
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
