DocumentCode
850595
Title
Session 7 Analytical and statistical techniques in reliability analysis
Author
Koppenhaver, J.T.
Author_Institution
NASA, Washington, D.C.
Volume
51
Issue
3
fYear
1963
fDate
3/1/1963 12:00:00 AM
Firstpage
508
Lastpage
508
Abstract
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1963.1919
Filename
1443849
Link To Document