DocumentCode :
850767
Title :
Life testing: Estimating the parameters of the Weibull distribution
Author :
Ravenis, J.V.J.
Author_Institution :
Johns Hopkins University, Baltimore, Md.
Volume :
51
Issue :
3
fYear :
1963
fDate :
3/1/1963 12:00:00 AM
Firstpage :
509
Lastpage :
509
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Life estimation; Life testing; Parameter estimation; Weibull distribution;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.1932
Filename :
1443862
Link To Document :
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