Title :
Statistical Variations in Failure Thresholds of Silicon Npn Transistors Subjected to Electrical Overstress
Author :
Alexander, David R. ; Enlow, Edward W. ; Karaskiewicz, Ronald J.
Author_Institution :
Sandia National Laboratories Albuquerque, NM 87185
Keywords :
Epitaxial layers; Fabrication; Information analysis; Probability; Semiconductor device packaging; Silicon; Testing; Topology; Wafer scale integration; Weapons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1980.4331088
