DocumentCode
850822
Title
Statistical Variations in Failure Thresholds of Silicon Npn Transistors Subjected to Electrical Overstress
Author
Alexander, David R. ; Enlow, Edward W. ; Karaskiewicz, Ronald J.
Author_Institution
Sandia National Laboratories Albuquerque, NM 87185
Volume
27
Issue
6
fYear
1980
Firstpage
1680
Lastpage
1687
Keywords
Epitaxial layers; Fabrication; Information analysis; Probability; Semiconductor device packaging; Silicon; Testing; Topology; Wafer scale integration; Weapons;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1980.4331088
Filename
4331088
Link To Document