• DocumentCode
    851070
  • Title

    Improvement of the spectral response in large CdTe detectors operating at low bias voltage

  • Author

    Nishizawa, Hiroshi ; Inujima, Hiroshi ; Takashima, Kazuo

  • Author_Institution
    Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
  • Volume
    49
  • Issue
    4
  • fYear
    2002
  • fDate
    8/1/2002 12:00:00 AM
  • Firstpage
    2025
  • Lastpage
    2031
  • Abstract
    This paper reports a method to improve the energy resolution for γ rays of a CdTe semiconductor detector 15 × 15 × 15 mm3 in size and with low applied voltage and an adequate electronic circuit constant. The principle of improvement is to make use of carrier trapping and ballistic defects. We investigated the improvement of the energy resolution by calculating the output waveforms using a Monte Carlo simulation. As a result, we could obtain an approximately 8% energy resolution of 662 keV equivalent to that of an NaI(Tl) scintillator. Further, the intrinsic efficiency of a full energy peak equivalent to that of a 1-in-thick cylindrical NaI(Tl) scintillator could be achieved. This method has the advantages that the energy spectra can be improved by simple systems and the noise is reduced because of the low leakage current due to the low applied voltage.
  • Keywords
    Monte Carlo methods; cadmium compounds; carrier mobility; gamma-ray detection; high energy physics instrumentation computing; nuclear electronics; semiconductor counters; 1 in; 15 mm; 662 keV; CdTe; Monte Carlo simulation; ballistic defects; carrier trapping; electronic circuit constant; energy resolution; full energy peak; gamma-rays; large detectors; low bias voltage; semiconductor detector; spectral response; Charge carrier processes; Detectors; Electron traps; Energy resolution; Leakage current; Low voltage; Manufacturing; Noise reduction; Semiconductor device noise; Spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.801715
  • Filename
    1043356