DocumentCode :
851070
Title :
Improvement of the spectral response in large CdTe detectors operating at low bias voltage
Author :
Nishizawa, Hiroshi ; Inujima, Hiroshi ; Takashima, Kazuo
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
Volume :
49
Issue :
4
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
2025
Lastpage :
2031
Abstract :
This paper reports a method to improve the energy resolution for γ rays of a CdTe semiconductor detector 15 × 15 × 15 mm3 in size and with low applied voltage and an adequate electronic circuit constant. The principle of improvement is to make use of carrier trapping and ballistic defects. We investigated the improvement of the energy resolution by calculating the output waveforms using a Monte Carlo simulation. As a result, we could obtain an approximately 8% energy resolution of 662 keV equivalent to that of an NaI(Tl) scintillator. Further, the intrinsic efficiency of a full energy peak equivalent to that of a 1-in-thick cylindrical NaI(Tl) scintillator could be achieved. This method has the advantages that the energy spectra can be improved by simple systems and the noise is reduced because of the low leakage current due to the low applied voltage.
Keywords :
Monte Carlo methods; cadmium compounds; carrier mobility; gamma-ray detection; high energy physics instrumentation computing; nuclear electronics; semiconductor counters; 1 in; 15 mm; 662 keV; CdTe; Monte Carlo simulation; ballistic defects; carrier trapping; electronic circuit constant; energy resolution; full energy peak; gamma-rays; large detectors; low bias voltage; semiconductor detector; spectral response; Charge carrier processes; Detectors; Electron traps; Energy resolution; Leakage current; Low voltage; Manufacturing; Noise reduction; Semiconductor device noise; Spectroscopy;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.801715
Filename :
1043356
Link To Document :
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