Title :
Stabilization of the Hall effect multiplier
Author :
Heid, Kris ; Silverman, Daniel
Author_Institution :
Beckman Instruments, Inc., Fullerton, Calif.
fDate :
3/1/1963 12:00:00 AM
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Anisotropic magnetoresistance; Conducting materials; Crystalline materials; Degradation; Hall effect; Power supplies; Thermoelectric devices; Thin film circuits; Thin film transistors; Voltage control;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.1970
