Title :
Self-repairing procedures
Author :
Kramer, D.H. ; Jarnagin, W.S.
Author_Institution :
MB Electronics, New Haven, Conn.
fDate :
3/1/1963 12:00:00 AM
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Anisotropic magnetoresistance; Batteries; Conducting materials; Crystalline materials; Degradation; Satellites; Semiconductor diodes; Thin film circuits; Thin film transistors; Voltage control;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.1971
