DocumentCode
851231
Title
Evaluation of the effect of X-ray detectable defects on electrical performance of semiconductors
Author
Morris, R.L. ; Wolin, D.
Author_Institution
Lockheed Missiles and Space Co., Palo Alto, Calif.
Volume
51
Issue
3
fYear
1963
fDate
3/1/1963 12:00:00 AM
Firstpage
514
Lastpage
514
Abstract
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords
Batteries; Gas detectors; Power system reliability; Satellites; Semiconductor diodes; Testing; Voltage control; Wire; X-ray detection; X-ray detectors;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1963.1975
Filename
1443905
Link To Document