Title :
Comparative surface plasmon spectroscopy for characterisation of thin films
Author :
Hlavenkova, Z. ; Homola, Jeffrey
Author_Institution :
Inst. of Photonics & Electron. ASCR, Prague
Abstract :
A new method for the characterisation of thin films - comparative surface plasmon spectroscopy - is introduced, and the application of this method for the determination of a refractive index of a thin SiO2 film is described.
Keywords :
dielectric thin films; infrared spectroscopy; refractive index; surface plasmons; visible spectroscopy; refractive index; surface plasmon spectroscopy; thin films;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20081959
