DocumentCode :
851329
Title :
Absolute number of scintillation photons emitted by alpha particles in rare gases
Author :
Saito, K. ; Tawara, H. ; Sanami, T. ; Shibamura, E. ; Sasaki, S.
Author_Institution :
Graduated Univ. for Adv. Studies, Ibaraki, Japan
Volume :
49
Issue :
4
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
1674
Lastpage :
1680
Abstract :
To determine absolute scintillation yields due to alpha particles in high-pressure rare gases, the number of scintillation photons Np was measured using a vacuum ultraviolet (VUV) sensitive photodiode with spectral quantum efficiency qe(λ) measured as a function of wavelength λ. The absolute number of photoelectrons from the photocathode Npe was measured using a charge-sensitive preamplifier calibrated with respect to charge number. The collection efficiency for scintillation photons Fce at the photocathode was determined from the solid angle subtended by the photocathode at a scintillation point under the condition that there are no photons reflected off the surrounding walls. NP was determined from Np = Npe/(QeFce), where Qe is the average quantum efficiency calculated from qe(λ) and a relative intensity I(λ) of scintillation in rare gases. We measured the luminescence spectra using a VUV monochromator of known efficiency in order to obtain I(λ). Measurements were performed in gaseous argon, krypton, and xenon in the pressure range from 1.01 × 105 Pa to 1.01 × 106 Pa. Np in xenon at 1.01 × 105 Pa is 1.60 × 105 for 5.49-MeV alpha particles.
Keywords :
argon; ionoluminescence; krypton; scintillation; xenon; 101000 to 1010000 Pa; 5.49 MeV; Ar; Kr; VUV sensitive photodiode; Xe; absolute scintillation yields; alpha particles; collection efficiency; luminescence spectra; photoelectrons; pressure; quantum efficiency; rare gases; scintillation photons; Alpha particles; Cathodes; Current measurement; Elementary particle vacuum; Gases; Particle measurements; Photodiodes; Q measurement; Wavelength measurement; Xenon;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.801700
Filename :
1043429
Link To Document :
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