• DocumentCode
    851329
  • Title

    Absolute number of scintillation photons emitted by alpha particles in rare gases

  • Author

    Saito, K. ; Tawara, H. ; Sanami, T. ; Shibamura, E. ; Sasaki, S.

  • Author_Institution
    Graduated Univ. for Adv. Studies, Ibaraki, Japan
  • Volume
    49
  • Issue
    4
  • fYear
    2002
  • fDate
    8/1/2002 12:00:00 AM
  • Firstpage
    1674
  • Lastpage
    1680
  • Abstract
    To determine absolute scintillation yields due to alpha particles in high-pressure rare gases, the number of scintillation photons Np was measured using a vacuum ultraviolet (VUV) sensitive photodiode with spectral quantum efficiency qe(λ) measured as a function of wavelength λ. The absolute number of photoelectrons from the photocathode Npe was measured using a charge-sensitive preamplifier calibrated with respect to charge number. The collection efficiency for scintillation photons Fce at the photocathode was determined from the solid angle subtended by the photocathode at a scintillation point under the condition that there are no photons reflected off the surrounding walls. NP was determined from Np = Npe/(QeFce), where Qe is the average quantum efficiency calculated from qe(λ) and a relative intensity I(λ) of scintillation in rare gases. We measured the luminescence spectra using a VUV monochromator of known efficiency in order to obtain I(λ). Measurements were performed in gaseous argon, krypton, and xenon in the pressure range from 1.01 × 105 Pa to 1.01 × 106 Pa. Np in xenon at 1.01 × 105 Pa is 1.60 × 105 for 5.49-MeV alpha particles.
  • Keywords
    argon; ionoluminescence; krypton; scintillation; xenon; 101000 to 1010000 Pa; 5.49 MeV; Ar; Kr; VUV sensitive photodiode; Xe; absolute scintillation yields; alpha particles; collection efficiency; luminescence spectra; photoelectrons; pressure; quantum efficiency; rare gases; scintillation photons; Alpha particles; Cathodes; Current measurement; Elementary particle vacuum; Gases; Particle measurements; Photodiodes; Q measurement; Wavelength measurement; Xenon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.801700
  • Filename
    1043429