DocumentCode :
851508
Title :
Analog peak detector and derandomizer for high-rate spectroscopy
Author :
De Geronimo, Gianluigi ; Kandasamy, Anand ; O´Connor, Paul
Author_Institution :
Instrum. Div., Brookhaven Nat. Lab., Upton, NY, USA
Volume :
49
Issue :
4
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
1769
Lastpage :
1773
Abstract :
A compact and accurate readout system has been developed for high-rate spectroscopy with multi-element detectors. The fully self-triggered system multiplexes the signals from 32 detectors into a novel peak detector, which also serves as a derandomizer. The captured pulse heights are stored as analog samples before being presented to the ADC along with the corresponding channel addresses. The peak detector incorporates a new two-phase configuration that cancels offsets and other errors found in conventional designs. Offset cancellation gives the peak detector rail-to-rail sensing and driving capability and permits two or more peak detectors to be operated in parallel to serve as a data-driven analog memory. First experimental results on the new peak detector and derandomizer (PDD) circuit, fabricated in 0.35 μm CMOS technology, include a 0.2% absolute accuracy for pulses with 500-ns peaking time, 2.7-V linear-input range, 3.5-mW power dissipation, 250-mV/s droop rate, and negligible dead time. We have tested the system with 32 CZT detectors and a 241Am source. The spectra collected from the 32-channel system show that the noise performance of the preamp/shaper is not degraded by the multiplexing, peak detecting, and derandomizing operations.
Keywords :
CMOS analogue integrated circuits; II-VI semiconductors; cadmium compounds; nuclear electronics; semiconductor counters; wide band gap semiconductors; CMOS technology; CZT detectors; CdZnTe; channel addresses; data-driven analog memory; derandomizer; fully self-triggered system; high-rate spectroscopy; multi-element detectors; rail-to-rail driving capability; rail-to-rail sensing capability; two-phase configuration; Analog memory; CMOS memory circuits; CMOS technology; Circuit testing; Detectors; Power dissipation; Pulse circuits; Signal detection; Spectroscopy; System testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.801701
Filename :
1043499
Link To Document :
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