Title :
Low-frequency noise characterization of very large value resistors
Author :
Amaboldi, C. ; Bucci, C. ; Cremonesi, O. ; Fascilla, A. ; Nucciotti, A. ; Pavan, M. ; Pessina, G. ; Pirro, S. ; Previtali, E. ; Sisti, M.
Author_Institution :
Ist. Nazionale di Fisica Nucl., Milan, Italy
fDate :
8/1/2002 12:00:00 AM
Abstract :
A simple circuit configuration is described that allows one to characterize the noise of very large value resistors. With this measurement setup, we investigated, at different bias voltages, the low-frequency noise of large value resistors, tens of GΩ range, realized with different technologies. A technique is suggested that allows reducing the low-frequency noise contribution by optimizing the connecting arrangement. A short review of the resistor noise theory is given.
Keywords :
integrated circuit noise; nuclear electronics; resistors; semiconductor device noise; low-frequency noise characterization; low-frequency noise contribution; measurement setup; semiconductor device noise; simple circuit configuration; very large value resistors; Bolometers; Circuits; Detectors; Leak detection; Low-frequency noise; Noise measurement; Resistors; Semiconductor device noise; Thermal resistance; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.801507
