• DocumentCode
    85180
  • Title

    Modeling and Design Guidelines for {\\rm P}^{+} Guard Rings in Lightly Doped CMOS Substrates

  • Author

    Ming Shen ; Mikkelsen, Jan H. ; Ke Zhang ; Jensen, Ole K. ; Tong Tian ; Larsen, Torben

  • Author_Institution
    Dept. of Electron. Syst., Aalborg Univ., Aalborg, Denmark
  • Volume
    60
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    2854
  • Lastpage
    2861
  • Abstract
    This paper presents a compact model for P+ guard rings in lightly doped CMOS substrates featuring a P-well layer. Simple expressions for the impedances in the model are derived based on a conformal mapping approach. The model can be used to predict the noise suppression performance of P+ guard rings in terms of S-parameters, which is useful for substrate noise mitigation in mixed-signal system-on-chips. Validation of the model has been done by both electromagnetic simulation and experimental results from guard rings implemented using a standard 0.18- μm CMOS process. In addition, design guidelines have been drawn for minimizing the guard ring size while maintaining the noise suppression performance.
  • Keywords
    CMOS integrated circuits; S-parameters; conformal mapping; electric impedance; integrated circuit design; integrated circuit modelling; integrated circuit noise; interference suppression; mixed analogue-digital integrated circuits; semiconductor doping; substrates; system-on-chip; CMOS process; P+ guard rings; P-well layer; S-parameters; compact model; conformal mapping approach; design guidelines; electromagnetic simulation; guard ring size; impedances; lightly doped CMOS substrates; mixed-signal system-on-chips; noise suppression performance; size 0.18 mum; substrate noise mitigation; Conductivity; Integrated circuit modeling; Layout; Noise; Resistance; Semiconductor device modeling; Substrates; ${rm P}^{+}$ contact; Compact model; P-well; guard ring; mixed-signal IC; substrate noise;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2275177
  • Filename
    6581872