DocumentCode :
851850
Title :
Session 26 Measurement devices and techniques
Author :
Benoit, G.F.
Author_Institution :
Sanborn Company, Waltham, Mass.
Volume :
51
Issue :
3
fYear :
1963
fDate :
3/1/1963 12:00:00 AM
Firstpage :
521
Lastpage :
521
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Calibration; Displays; Inspection; Instruments; Operational amplifiers; Oscilloscopes; Power amplifiers; Stability; Standards development; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.2032
Filename :
1443962
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=851850
