• DocumentCode
    852012
  • Title

    Radiation damage in semiconductor devices

  • Author

    Easley, J.W.

  • Author_Institution
    Sandia Corp., Albuquerque, N. Mex.
  • Volume
    51
  • Issue
    3
  • fYear
    1963
  • fDate
    3/1/1963 12:00:00 AM
  • Firstpage
    522
  • Lastpage
    522
  • Abstract
    Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
  • Keywords
    Character recognition; Electron traps; Electronic components; Equations; Inductors; Magnetic shielding; Neutrons; Nuclear weapons; Protons; Semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.2046
  • Filename
    1443976
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=852012