Three-dimensional magnetic field measurement of a modified thin-film magnetic head for vertical recording by means of Lorentz-tomography

Author

Steck, M. ; Schewe, H. ; Kubalek, E.

Author_Institution

Werkstoffe der Elektrotech., Duisburg Univ., West Germany

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

1343

Lastpage

1345

Abstract

The method of Lorentz tomography with an electron beam as a microprobe, combined with an analytical reconstruction procedure, has been successfully adapted to thin-film heads for vertical recording. It is noted that the measured results can be used as a basis for adjusting the magnetic parameters of the thin-film head to achieve good agreement with corresponding FEM or BEM (finite element or boundary element method) calculations. It is concluded that Lorentz tomography can be used as an important tool in the design of thin-film magnetic heads

Keywords

magnetic heads; magnetic recording; magnetic thin films; 3D magnetic field measurement; Lorentz-tomography; boundary element method; finite element; magnetic parameters; modified thin-film magnetic head; vertical recording; Boundary element methods; Electron beams; Finite element methods; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic heads; Perpendicular magnetic recording; Tomography; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104369

Filename

104369