Title :
Absorption and dispersion of low-loss dielectrics measured with microwave transient radiation
Author :
Pastol, Yves ; Arjavalingam, G. ; Halbout, J.-M. ; Kopcsay, Gerard V.
Author_Institution :
IBM Res. Div., Thomas J. Watson Res. Centre., Yorktown Heights, NY, USA
fDate :
4/13/1989 12:00:00 AM
Abstract :
Measurements of the frequency-dependent loss and dispersion of low-loss dielectrics, between 10 and 130 GHz, are presented. The data are obtained from a single experiment using the picosecond transient radiation from optoelectronically pulsed integrated antennas.
Keywords :
dielectric losses; dielectric materials; dielectric measurement; dispersion (wave); electromagnetic wave absorption; microwave measurement; permittivity; 10 to 130 GHz; EHF; SHF; Teflon; alumina ceramic; coherent microwave transient spectroscopy; dielectric constant; dispersion; frequency-dependent loss; low-loss dielectrics; microwave transient radiation; optoelectronically pulsed integrated antennas; permittivity; picosecond transient radiation; polyimide;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890358
