• DocumentCode
    852265
  • Title

    Absorption and dispersion of low-loss dielectrics measured with microwave transient radiation

  • Author

    Pastol, Yves ; Arjavalingam, G. ; Halbout, J.-M. ; Kopcsay, Gerard V.

  • Author_Institution
    IBM Res. Div., Thomas J. Watson Res. Centre., Yorktown Heights, NY, USA
  • Volume
    25
  • Issue
    8
  • fYear
    1989
  • fDate
    4/13/1989 12:00:00 AM
  • Firstpage
    523
  • Lastpage
    524
  • Abstract
    Measurements of the frequency-dependent loss and dispersion of low-loss dielectrics, between 10 and 130 GHz, are presented. The data are obtained from a single experiment using the picosecond transient radiation from optoelectronically pulsed integrated antennas.
  • Keywords
    dielectric losses; dielectric materials; dielectric measurement; dispersion (wave); electromagnetic wave absorption; microwave measurement; permittivity; 10 to 130 GHz; EHF; SHF; Teflon; alumina ceramic; coherent microwave transient spectroscopy; dielectric constant; dispersion; frequency-dependent loss; low-loss dielectrics; microwave transient radiation; optoelectronically pulsed integrated antennas; permittivity; picosecond transient radiation; polyimide;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890358
  • Filename
    46143
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=852265