DocumentCode :
852365
Title :
Epitaxial Silicon Position Sensitive Detectors
Author :
Shiraishi, F. ; Kim, C. ; Kim, H. ; Kikuchi, K. ; Husimi, K. ; Ohkawa, S.
Author_Institution :
Institute for Atomic Energy, Rikkyo University Yokosuka, Kanagawa 240-01, Japan
Volume :
28
Issue :
1
fYear :
1981
Firstpage :
554
Lastpage :
557
Abstract :
A position sensitive detector has been made on a N-type epitaxial silicon wafer using the epitaxial layer as the uniform resistive layer. The surface barrier electrode is produced on the opposite side of the epitaxial layer by evaporation of gold. The position sensitive detector obtained has good characteristics and moreover it is easy to fabricate. So that the epitaxial technique will be promising even over the conventional ion implantation technique for fabrication of position sensitive silicon detector.
Keywords :
Conductivity; Electrical resistance measurement; Electrodes; Epitaxial layers; Fabrication; Gold; Position sensitive particle detectors; Silicon; Substrates; Surface resistance;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1981.4331238
Filename :
4331238
Link To Document :
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