DocumentCode
85240
Title
Planar Zero Bias Schottky Diodes on an InGaAs Metamorphic HEMT MMIC Process
Author
Thome, Fabian ; Leuther, A. ; Maroldt, S. ; Schlechtweg, Michael ; Ambacher, Oliver
Author_Institution
Fraunhofer Inst. for Appl. Solid State Phys. IAF, Freiburg, Germany
Volume
24
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
860
Lastpage
862
Abstract
In this letter, the realization of planar zero bias Schottky diodes on an InGaAs metamorphic high-electron-mobility transistor (mHEMT) MMIC technology is presented. The aim is to investigate the optimum performance for detector applications in an integrated MMIC solution. Device optimization was performed, by analyzing the voltage responsivity of each single diode variation. Voltage responsivities of up to 18000 V/W at W-band frequencies on an intrinsic diode level were achieved. Furthermore, a detector MMIC centered around 105 GHz was realized with a maximum voltage responsivity of 7700 V/W.
Keywords
HEMT integrated circuits; III-V semiconductors; MMIC; Schottky diodes; gallium arsenide; indium compounds; InGaAs; W-band frequency; device optimization; intrinsic diode level; mHEMT MMIC technology; metamorphic HEMT MMIC process; metamorphic high-electron-mobility transistor; planar zero bias Schottky diodes; voltage responsivity; Detectors; Indium gallium arsenide; MMICs; Millimeter wave technology; Schottky diodes; Voltage measurement; mHEMTs; Envelope detector; HEMTs; MMICs; Schottky diodes; indium gallium arsenide (InGaAs); millimeter wave; square-law detector;
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/LMWC.2014.2359367
Filename
6909085
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