DocumentCode :
852467
Title :
Cryogenic monolithic sapphire-rutile temperature compensated resonator oscillator
Author :
Kersalé, Yann ; Vives, Serge ; Meunier, Cathy ; Giordano, Vincent
Author_Institution :
LPMO, Univ. de Franche-Comte, Besancon, France
Volume :
50
Issue :
12
fYear :
2003
Firstpage :
1662
Lastpage :
1666
Abstract :
We have tested a new temperature-compensated sapphire resonator as frequency determining element for high-stability microwave oscillator. Temperature compensation has been obtained by coating the sapphire resonator with a thin rutile film. A 2-/spl mu/m rutile thickness is sufficient to reach turnover temperature higher than 40 K, and a 2/spl times/10/sup -12/ short-term frequency stability has been obtained.
Keywords :
compensation; cryogenics; frequency stability; microwave oscillators; resonators; 2 micron; 40 K; Al/sub 2/O/sub 3/-TiO/sub 2/; cryogenics; frequency determining element; frequency stability; high stability microwave oscillator; monolithic sapphire-rutile temperature compensation; resonator oscillator; rutile thickness; sapphire resonator; thin rutile film; Cryogenics; Dielectric losses; Microwave oscillators; Permittivity; Q factor; Resonant frequency; Stability; Temperature sensors; Testing;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2003.1256306
Filename :
1256306
Link To Document :
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