Title :
Full-reference image quality assessment using statistical local correlation
Author :
Yong Ding ; Shaoze Wang ; Dong Zhang
Author_Institution :
Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China
Abstract :
A novel full-reference image quality assessment metric employing statistical local correlation as an indicator for quality quantification is presented. The local correlation is extracted in a wavelet domain and is pooled into an objective quality score. Simulation and testing results demonstrate that the proposed method not only outperforms the other methods in terms of high accuracy of image quality prediction, but also is consistent with the subjective evaluations.
Keywords :
correlation methods; image processing; statistical analysis; wavelet transforms; full-reference image quality assessment metric; objective quality score; quality quantification; statistical local correlation; subjective evaluations; wavelet domain;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2013.3365