Title :
Proton-neutron damage correlation in semiconductors
Author :
Bilinski, J.R. ; Brooks, E.H. ; Cocca, U. ; Maier, Robert
Author_Institution :
General Electric Co., Syracuse, N. Y.
fDate :
3/1/1963 12:00:00 AM
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Microwave theory and techniques; NASA; Neutrons; Noise level; Optimal control; Protons; Radar applications; Radar tracking; Semiconductor diodes; Silicon;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.2114
