Polytechnic Institute of Brooklyn, Brooklyn, N. Y.
Volume :
51
Issue :
3
fYear :
1963
fDate :
3/1/1963 12:00:00 AM
Firstpage :
530
Lastpage :
530
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Frequency measurement; Laboratories; Microwave theory and techniques; Noise level; Phase measurement; Power measurement; Pulse measurements; Radar applications; Radar tracking; Semiconductor diodes;
